first version of embedded test stand done

configs/test_cases/test_endurance_50_60_marchFTE_5.json

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+{
+  "meta": {
+    "name": "endurance_50_60_marchFTE_5",
+    "description": "start endurance test in NAND Flash",
+    "parameters": {
+      "cmd_code": 22,
+      "block_check_cnt": 2,
+      "blocks": [50, 60]
+    }
+  },
+
+  "binary": "C:/Danila/work/embedded_test_stand/cmd/endurance_50_60_marchFTE_5.bin",
+
+  "expectations": {
+    "start": {
+      "type": "json",
+      "fields": {
+        "msgType": 2,
+        "cmd": 22
+      }
+    },
+
+    "sequence": [
+      {
+        "type": "contains",
+        "value": "Current state of cycle counters:"
+      }
+    ],
+
+    "end": null
+  },
+
+  "timeout_msec": 9000
+}

configs/test_cases/test_get_badBlockMap_fromNAND.json

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+{
+  "meta": {
+    "name": "get_savedBadBlockMap_fromNAND",
+    "description": "get bad block map from NAND Flash into RAM",
+    "parameters": {
+      "cmd_code": 4,
+      "badBlockMapOperMode": 2
+    }
+  },
+
+  "binary": "C:/Danila/work/embedded_test_stand/cmd/get_savedBadBlockMap_fromNAND.bin",
+
+  "expectations": {
+    "start": {
+      "type": "json",
+      "fields": {
+        "msgType": 2,
+        "cmd": 4
+      }
+    },
+
+    "end": {
+      "type": "contains",
+      "value": "NAND Flash test stand ready to receive new commands"
+    }
+  },
+
+  "timeout_msec": 200
+}

configs/test_cases/test_randomDataTest_100_110.json

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+{
+  "meta": {
+    "name": "randomDataTest_100_110",
+    "description": "start random data test in all target of NAND Flash",
+    "parameters": {
+      "cmd_code": 19,
+      "mode_random": 2,
+      "seed":1,
+      "begin_block": 100,
+      "end_block": 110
+    }
+  },
+
+  "binary": "C:/Danila/work/embedded_test_stand/cmd/randomDataTest_blocks_100_110_seed_1.bin",
+
+  "expectations": {
+    "start": {
+      "type": "json",
+      "fields": {
+        "msgType": 2,
+        "cmd": 19
+      }
+    },
+
+    "end": {
+      "type": "contains",
+      "value": "NAND Flash test stand ready to receive new commands"
+    }
+  },
+
+  "timeout_msec": 5000
+}

configs/test_cases/test_set_micron_MT29F16G08AJADAWP.json

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+{
+  "meta": {
+    "name": "set_micron_MT29F16G08AJADAWP",
+    "description": "check settings for micron_MT29F16G08AJADAWP",
+    "parameters": {
+      "cmd_code": 5,
+      "endurance": 100000,
+      "timerPeriod": 100,
+      "timeoutProgPageDMA": 600,
+      "timeoutReadPageDMA":600,
+      "extMemTurnCycles": 1,
+      "extMemeWriteCycles": 1,
+      "extMemReadCycles": 1,
+      "DMAincr": 0,
+      "repeatOper": 1
+    }
+  },
+
+  "binary": "C:/Danila/work/embedded_test_stand/cmd/set_settings_NAND_micron_MT29F16G08AJADAWP.bin",
+
+  "expectations": {
+    "start": {
+      "type": "json",
+      "fields": {
+        "msgType": 2,
+        "cmd": 5
+      }
+    },
+
+    "end": {
+      "type": "contains",
+      "value": "NAND Flash test stand ready to receive new commands"
+    }
+  },
+
+  "timeout_msec": 200
+}

configs/test_cases/test_start_March_FTE_all_targ0_repeat2.json

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+{
+  "meta": {
+    "name": "start_March-FTE_all_targ0_repeat2",
+    "description": "start March-FTE for all target",
+    "parameters": {
+      "cmd_code": 20,
+      "target": 0,
+      "repeat": 2
+    }
+  },
+
+  "binary": "C:/Danila/work/embedded_test_stand/cmd/start_March-FTE_all_targ0_repeat2.bin",
+
+  "expectations": {
+    "start": {
+      "type": "json",
+      "fields": {
+        "msgType": 2,
+        "cmd": 20
+      }
+    },
+
+    "sequence": [
+      {
+        "type": "contains",
+        "value": "increment block address, erase blocks"
+      }
+    ],
+
+    "end": null
+  },
+
+  "timeout_msec": 10000
+}

configs/test_cases/test_start_March_FTE_by_blocks.json

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+{
+  "meta": {
+    "name": "start_March-FTE_by_blocks",
+    "description": "start March-FTE by specified blocks",
+    "parameters": {
+      "cmd_code": 21,
+      "mode_March_FTE": 2,
+      "begin_block": 20,
+      "end_block": 25
+    }
+  },
+
+  "binary": "C:/Danila/work/embedded_test_stand/cmd/start_March-FTE_by_blocks_20_25.bin",
+
+  "expectations": {
+    "start": {
+      "type": "json",
+      "fields": {
+        "msgType": 2,
+        "cmd": 21
+      }
+    },
+
+    "sequence": [
+      {
+        "type": "regex",
+        "value": "start march-FTE in block \\d+(, LUN 0, Target 0)?"
+      },
+      {
+        "type": "regex",
+        "value": "start march-FTE in block \\d+(, LUN 0, Target 0)?"
+      },
+      {
+        "type": "regex",
+        "value": "start march-FTE in block \\d+(, LUN 0, Target 0)?"
+      },
+      {
+        "type": "regex",
+        "value": "start march-FTE in block \\d+(, LUN 0, Target 0)?"
+      },
+      {
+        "type": "regex",
+        "value": "start march-FTE in block \\d+(, LUN 0, Target 0)?"
+      }
+    ],
+
+    "end": {
+      "type": "contains",
+      "value": "NAND Flash test stand ready to receive new commands"
+    }
+  },
+
+  "timeout_msec": 27000
+}

configs/test_plan.json

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+{
+  "groups": {
+    "smoke": [
+      "test_UART_cmdSetDataInterface.json",
+      "test_set_micron_MT29F16G08AJADAWP.json",
+      "test_get_badBlockMap_fromNAND.json"
+    ],
+
+    "full": [
+      "test_UART_cmdSetDataInterface.json",
+      "test_set_micron_MT29F16G08AJADAWP.json",
+      "test_get_badBlockMap_fromNAND.json",
+      "test_start_March_FTE_by_blocks.json",
+      "test_randomDataTest_100_110.json",
+      "test_endurance_50_60_marchFTE_5.json",
+      "test_abort.json",
+      "#test_start_March_FTE_all_targ0_repeat2.json",
+      "#test_abort.json"
+    ],
+
+    "abort": [
+      "test_abort.json"
+    ]
+  }
+}