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eliminate faults. First stable version works as separate .exe file with configurations file

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This commit is contained in:
Danila
2026-05-23 01:49:30 +03:00
parent 47395d02d6
commit f2457f2bb6
16 changed files with 280 additions and 126 deletions
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7
configs/test_cases/test_endurance_50_60_marchFTE_5.json
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@@ -2,8 +2,11 @@
"meta": {
"name": "endurance_50_60_marchFTE_5",
"description": "start endurance test in NAND Flash",
"input_data_type": "text",
"parameters": {
"_comment": "protocol_ID = 1 for text format from UART, see protocol_ID_en",
"protocol_ID": 1,
"version": 1,
"cmd_from_binary_file": true,
"cmd_code": 22,
"block_check_cnt": 2,
"blocks": [50, 60]
@@ -31,5 +34,5 @@
"end": null
},
"timeout_msec": 9000
"timeout_msec": 20000
}

5
configs/test_cases/test_get_badBlockMap_fromNAND.json
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@@ -2,8 +2,11 @@
"meta": {
"name": "get_savedBadBlockMap_fromNAND",
"description": "get bad block map from NAND Flash into RAM",
"input_data_type": "text",
"parameters": {
"_comment": "protocol_ID = 1 for text format from UART, see protocol_ID_en",
"protocol_ID": 1,
"version": 1,
"cmd_from_binary_file": true,
"cmd_code": 4,
"badBlockMapOperMode": 2
}

5
configs/test_cases/test_randomDataTest_100_110.json
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@@ -2,8 +2,11 @@
"meta": {
"name": "randomDataTest_100_110",
"description": "start random data test in all target of NAND Flash",
"input_data_type": "text",
"parameters": {
"_comment": "protocol_ID = 1 for text format from UART, see protocol_ID_en",
"protocol_ID": 1,
"version": 1,
"cmd_from_binary_file": true,
"cmd_code": 19,
"mode_random": 2,
"seed":1,

5
configs/test_cases/test_set_micron_MT29F16G08AJADAWP.json
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@@ -2,8 +2,11 @@
"meta": {
"name": "set_micron_MT29F16G08AJADAWP",
"description": "check settings for micron_MT29F16G08AJADAWP",
"input_data_type": "text",
"parameters": {
"_comment": "protocol_ID = 1 for text format from UART, see protocol_ID_en",
"protocol_ID": 1,
"version": 1,
"cmd_from_binary_file": true,
"cmd_code": 5,
"endurance": 100000,
"timerPeriod": 100,

5
configs/test_cases/test_start_March_FTE_all_targ0_repeat2.json
View File

@@ -2,8 +2,11 @@
"meta": {
"name": "start_March-FTE_all_targ0_repeat2",
"description": "start March-FTE for all target",
"input_data_type": "text",
"parameters": {
"_comment": "protocol_ID = 1 for text format from UART, see protocol_ID_en",
"protocol_ID": 1,
"version": 1,
"cmd_from_binary_file": true,
"cmd_code": 20,
"target": 0,
"repeat": 2

5
configs/test_cases/test_start_March_FTE_by_blocks.json
View File

@@ -2,8 +2,11 @@
"meta": {
"name": "start_March-FTE_by_blocks",
"description": "start March-FTE by specified blocks",
"input_data_type": "text",
"parameters": {
"_comment": "protocol_ID = 1 for text format from UART, see protocol_ID_en",
"protocol_ID": 1,
"version": 1,
"cmd_from_binary_file": true,
"cmd_code": 21,
"mode_March_FTE": 2,
"begin_block": 20,

22
configs/test_plan.json
View File

@@ -6,9 +6,6 @@
"test_set_micron_MT29F16G08AJADAWP.json",
"test_readSnapshot_HK.json",
"test_get_badBlockMap_fromNAND.json",
"test_readSnapshot_HK.json",
"test_erase_all.json",
"test_abort.json",
"test_readSnapshot_HK.json"
],
@@ -19,6 +16,9 @@
"test_readSnapshot_HK.json",
"test_get_badBlockMap_fromNAND.json",
"test_readSnapshot_HK.json",
"test_erase_all.json",
"test_abort.json",
"test_readSnapshot_HK.json",
"test_start_March_FTE_by_blocks.json",
"test_readSnapshot_HK.json",
"test_randomDataTest_100_110.json",
@@ -28,6 +28,9 @@
"test_readSnapshot_HK.json",
"test_start_March_FTE_all_targ0_repeat2.json",
"test_abort.json",
"test_readSnapshot_HK.json",
"test_start_retention_rand_25_bin.json",
"test_abort.json",
"test_readSnapshot_HK.json"
],
@@ -35,10 +38,17 @@
"test_abort.json"
],
"endurance": [
"test_endurance_50_60_marchFTE_5_100.json",
"test_abort.json"
],
"one": [
"test_UART_cmdSetDataInterface.json",
"test_readSnapshot_HK.json",
"test_read_NANDctrlOper.json"
"#test_UART_cmdSetDataInterface.json",
"test_start_retention_rand_25_bin.json",
"test_abort.json",
"#test_readSnapshot_HK.json",
"#test_read_NANDctrlOper.json"
]
}
}