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Embedded-System-Test-Automa…/configs/test_cases/test_randomDataTest_100_110.json

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{
"meta": {
"name": "randomDataTest_100_110",
"description": "start random data test in all target of NAND Flash",
"parameters": {
"_comment": "protocol_ID = 1 for text format from UART, see protocol_ID_en",
"protocol_ID": 1,
"version": 1,
"cmd_from_binary_file": true,
"cmd_code": 19,
"mode_random": 2,
"seed":1,
"begin_block": 100,
"end_block": 110
}
},
"binary": "randomDataTest_blocks_100_110_seed_1.bin",
"expectations": {
"start": {
"type": "json",
"fields": {
"msgType": 2,
"cmd": 19
}
},
"end": {
"type": "contains",
"value": "NAND Flash test stand ready to receive new commands"
}
},
"timeout_msec": 5000
}